4

Solidification of GeSi solid solution in near-zero-G conditions

Année:
1981
Langue:
english
Fichier:
PDF, 410 KB
english, 1981
8

Strains in macroporous silicon introduced by cyclic oxidation

Année:
2003
Langue:
english
Fichier:
PDF, 190 KB
english, 2003
9

X-ray determination of the surface compression force in the ion-doped layer in silicon

Année:
1983
Langue:
english
Fichier:
PDF, 227 KB
english, 1983
12

Diagnostics of highly doped czochralski-grown silicon crystals

Année:
2006
Langue:
english
Fichier:
PDF, 204 KB
english, 2006
13

The outlook for X-ray diffraction topography

Année:
2010
Langue:
english
Fichier:
PDF, 910 KB
english, 2010
21

Microdefects investigated by X-ray topography

Année:
1993
Langue:
english
Fichier:
PDF, 415 KB
english, 1993